Mixed-signal LSI relationship among measurement accuracy, yield, and test time

被引:0
|
作者
Kohinata, H
Arai, M
Fukumoto, S
Iwasaki, K
机构
关键词
D O I
10.1109/DBT.2004.1408952
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
As the degree of LSI integration is becoming rapidly greater and circuit size is becoming bigger, the bigger LSI test cost due to longer test time in LSI production becomes more serious. This paper will discuss how much impact mixed LSI measurement accuracy improvement affects test time and LSI yield by analyzing the test results in a production test. It will be a practical and effective example for the semiconductor industry to show the relationship among measurement accuracy, test time, and yield based on the actual test data.
引用
收藏
页码:43 / 45
页数:3
相关论文
共 50 条
  • [41] PARAMETRIC YIELD PREDICTION OF COMPLEX, MIXED-SIGNAL ICS
    OLEARY, M
    LYDEN, C
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1995, 30 (03) : 279 - 285
  • [42] A mixed-signal test bus and analog BIST with 'unlimited' time and voltage resolution
    Sunter, Stephen
    Roy, Aubin
    2011 16TH IEEE EUROPEAN TEST SYMPOSIUM (ETS), 2011, : 81 - 86
  • [43] Adaptive Test With Test Escape Estimation for Mixed-Signal ICs
    Stratigopoulos, Haralampos-G
    Streitwieser, Christian
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2018, 37 (10) : 2125 - 2138
  • [44] Test and evaluation of multiple embedded mixed-signal test cores
    Hafed, M
    Roberts, GW
    INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 1022 - 1030
  • [45] Systematic Analysis & Optimization of Analog/Mixed-Signal Circuits Balancing Accuracy and Design Time
    Colaci, Antonio
    Boarin, Gianluigi
    Roggero, Andrea
    Civardi, Lorenzo
    Roma, Carlo
    Ripp, Andreas
    Pronath, Michael
    Strube, Gunter
    SBCCI 2010: 23RD SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEMS DESIGN, PROCEEDINGS, 2010, : 37 - 42
  • [46] MIXED-SIGNAL DESIGN AND TEST - IN COOPERATION WITH THE EUROPEAN TEST CONFERENCE
    SOMA, M
    THATCHER, CW
    WILKINS, B
    MIELKE, JA
    BAKER, K
    SCHNEIDER, B
    OHLETZ, MJ
    MAUNDER, C
    IEEE DESIGN & TEST OF COMPUTERS, 1993, 10 (03): : 80 - 86
  • [47] Test and design-for-test of mixed-signal integrated circuits
    Lubaszewski, M
    Huertas, JL
    INFORMATION TECHNOLOGY: SELECTED TUTORIALS, 2004, 157 : 183 - 212
  • [48] Study of high-accuracy data acquisition in mixed-signal boundary scanning test system
    Hou Xingna
    Ma Jun
    Chen Shouhong
    PROCEEDINGS OF 2017 13TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS (ICEMI), VOL 1, 2017, : 384 - 387
  • [49] Statistically Enhanced Analogue and Mixed-Signal Design and Test
    Ramos, Pedro L.
    da Silva, Jose Machado
    Ferreira, Diogo R.
    Santos, Marcelino B.
    PROCEEDINGS OF THE 2016 IEEE 21ST INTERNATIONAL MIXED-SIGNALS TEST WORKSHOP (IMSTW), 2016,
  • [50] A MIXED-SIGNAL TEST PROGRAM-DEVELOPMENT ENVIRONMENT
    RAVN, M
    VLSI SYSTEMS DESIGN, 1987, 8 (09): : 32 - &