A mixed-voltage sensor readout circuit with on-chip calibration and built-in self-test

被引:14
|
作者
Mason, Andrew [1 ]
Chavan, Abhijeet V.
Wise, Kensall D.
机构
[1] Michigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA
[2] Guidant Corp, St Paul, MN 55112 USA
[3] Univ Michigan, Dept Elect & Comp Engn, Ctr Wireless Integrated MicroSyst, Ann Arbor, MI 48109 USA
基金
美国国家科学基金会;
关键词
capacitive sensor; electrostatic force feedback; sensor interface; sensor self-test; switched-capacitor (SC);
D O I
10.1109/JSEN.2007.897957
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reports a mixed-voltage mixed-signal chip for interfacing multiple capacitive transducers to embedded processors in integrated microsystems. A programmable switched-capacitor readout circuit accommodates capacitive sensors from 16 fF to 40 pF and allows self-test and online calibration. The 20 mm(2) chip has a sensitivity of 1.25 mV/ff and is realized in a 1 mu m n-well BiCMOS 2 P/2 M process that permits high-voltage operation, large-value resistors, and nonvolatile on-chip memory. An on-chip charge pump generates voltages up to 30 V that permits transducer electrostatic self-test. In normal operation mode, the chip provides a fast sensor readout consuming only 90 nJ of energy, making it suitable for portable applications.
引用
收藏
页码:1225 / 1232
页数:8
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