Built-in self-test for analog and mixed-signal designs

被引：0
|
作者：
Cheng, KT [1 ]
机构：
[1] UNIV CALIF SANTA BARBARA,DEPT ELECT & COMP ENGN,SANTA BARBARA,CA 93106
来源：
PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96) | 1996年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：197 / 197
页数：1
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