Built-in self-test approaches for analogue and mixed-signal integrated circuits

被引：0
|
作者：
Mir, S [1 ]
Lubaszewski, M [1 ]
Liberali, V [1 ]
Courtois, B [1 ]
机构：
[1] TIMA,F-38031 GRENOBLE,FRANCE
来源：
38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2 | 1996年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1145 / 1150
页数：6
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