Synthesis for arithmetic built-in self-test

被引:0
|
作者
Stroele, Albrecht P. [1 ]
机构
[1] Univ of Karlsruhe, Karlsruhe, Germany
关键词
D O I
暂无
中图分类号
学科分类号
摘要
17
引用
收藏
页码:165 / 170
相关论文
共 50 条
  • [1] Arithmetic built-in self-test for DSP cores
    Radecka, K
    Rajski, J
    Tyszer, J
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1997, 16 (11) : 1358 - 1369
  • [2] Arithmetic pattern generators for built-in self-test
    Stroele, AP
    INTERNATIONAL CONFERENCE ON COMPUTER DESIGN - VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS, 1996, : 131 - 134
  • [3] Built-in self-test
    Zorian, Yervant
    Microelectronic Engineering, 1999, 49 (01): : 135 - 138
  • [4] Built-in self-test
    Zorian, Y
    MICROELECTRONIC ENGINEERING, 1999, 49 (1-2) : 135 - 138
  • [5] A BUILT-IN SELF-TEST STRUCTURE FOR ARITHMETIC EXECUTION UNITS OF VLSIS
    IKENAGA, T
    TAKAHASHI, J
    ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS, 1995, 78 (04): : 68 - 78
  • [6] On Built-In Self-Test for Adders
    Pulukuri, Mary D.
    Stroud, Charles E.
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2009, 25 (06): : 343 - 346
  • [7] BUILT-IN SELF-TEST STRUCTURES
    MCCLUSKEY, EJ
    IEEE DESIGN & TEST OF COMPUTERS, 1985, 2 (02): : 29 - 36
  • [8] Economics of built-in self-test
    Ungar, LY
    Ambler, T
    IEEE DESIGN & TEST OF COMPUTERS, 2001, 18 (05): : 70 - 79
  • [9] On Built-In Self-Test for Multipliers
    Pulukuri, Mary D.
    Starr, George J.
    Stroud, Charles E.
    IEEE SOUTHEASTCON 2010: ENERGIZING OUR FUTURE, 2010, : 25 - 28
  • [10] On Built-In Self-Test for Adders
    Mary D. Pulukuri
    Charles E. Stroud
    Journal of Electronic Testing, 2009, 25 : 343 - 346