High Stable and Low Power 8T CNTFET SRAM Cell

被引:10
|
作者
Elangovan, M. [1 ]
Gunavathi, K. [2 ]
机构
[1] Govt Coll Engn, Dept Elect & Commun Engn, Krishnagiri, Tamil Nadu, India
[2] PSG Coll Technol, Dept Elect & Commun Engn, Coimbatore, Tamil Nadu, India
关键词
SRAM; CNTFET; SNM; low power; process variation; DESIGN; ARRAY;
D O I
10.1142/S0218126620500802
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Designing of Complementary Metal Oxide Semiconductor (CMOS) technology based VLSI circuits in deep submicron range includes many challenges like tremendous increase of leakage power. Design is also easily affected by process variation. The Carbon NanoTube Field Effect Transistor (CNTFET) is an alternative for Metal Oxide Semiconductor Field Effect Transistor (MOSFET) for nanoscale range VLSI circuits design. CNTFET offers best performance than MOSFET. It has high stability and consumes least power. Static Random Access Memory (SRAM) cells play a vital role in cache memory in most of the electronic circuits. In this paper, we have proposed a high stable and low power CNTFET based 8Transistor (8T) SRAM cell. The performance of proposed 8T SRAM cells for nominal chiral value (all CNTFET with m = 19, n = 0) and Dual chiral value (NCNTFET with m = 19, n = 0 and PCNTFETm = 16, n = 0) is compared with that of conventional 6T and 8T cells. From the simulation results, it is noted that the proposed structure consumes less power than conventional 6T and 8T cells during read/write operations and gives higher stability during write and hold modes. It consumes higher power than conventional 6T and 8T cells during hold mode and provides lower stability in read mode due to direct contact of bit lines with storage nodes. A comparative analysis of proposed and conventional 8T MOSFET SRAM has been done and the SRAM parameters are tabulated. The simulation is carried out using Stanford University 32 nm CNTFET model in HSPICE simulation tool.
引用
收藏
页数:18
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