A zeroing cell-to-cell interference page architecture with temporary LSB storing program scheme for sub-40nm MLC NAND flash memories and beyond

被引:17
|
作者
Park, Ki-Tae [1 ]
Kang, Myounggon [1 ]
Kim, Doogon [1 ]
Hwang, Soonwook [1 ]
Lee, Yeong-Taek [1 ]
Kim, Changhyun [1 ]
Kim, Kinam [1 ]
机构
[1] Samsung Elect Co Ltd, Memory Business, ATD, Semicond R&D Ctr, Hwasung City 445701, Gyeunggi Do, South Korea
关键词
D O I
10.1109/VLSIC.2007.4342709
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new page architecture with temporary LSB storing program scheme is presented as a breakthrough solution for sub-40nm FG (Floating-gate) MLC NAND flash memories and beyond. Without program speed degradation, the proposed method is able to eliminate 100% BL cell-to-cell and almost 50% WL cell-to-cell coupling interferences which are well known as a most critical scaling barrier for FG NAND flash memories.
引用
收藏
页码:188 / 189
页数:2
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