Minimizing Cell-to-Cell interference by Exploiting Differential Bit Impact Characteristics of Scaled MLC NAND Flash Memories

被引:0
|
作者
Di, Yejia [1 ]
Shi, Liang [1 ]
Gao, Congming [1 ]
Wu, Kaijie [1 ]
Xue, Chun Jason [2 ]
Sha, Edwin H. M. [1 ]
机构
[1] Chongqing Univ, Coll Comp Sci, Chongqing, Peoples R China
[2] City Univ Hong Kong, Dept Comp Sci, Kowloon, Hong Kong, Peoples R China
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Appealed by the market, flash memory density is being increasingly improved, and the technology scale is being reduced. Currently, scaled multi-level-cell (MLC) flash memory has been the dominant in the global flash memory markets. However, the reliability of MLC flash memory becomes the urgent challenge, where cell-to-cell interference has been well recognized as the major error source. In this work, we propose to minimize cell- to-cell interference through exploiting the differential impacts on the multiple-bit of MLC flash memories. MLC flash memory generally has two or more bits per cell, such as 2-bit/cell or 4bit/cell, which can be differentially interfered by neighboring cell programming. Based on the understanding of the programming characteristics of MLC flash memory, we found that higher-order bits can be higher interfered and be more significant interference sources. In order to understand the characteristics of cell-to-cell interference on the multiple bits, we first present cell-to-cell interference models for multiple bits, respectively. Then based on the model, a state mapping scheme is designed to minimize cell-to-cell interference through mapping the states of high-order bits. The mapping scheme is motivated by the recent studies on the cell-to-cell interference characteristics of the multiple cell states of flash memory, where different states have varying interferences. In this case, high-order bits should be mapped from high interference states to a low one. A series of experiments show that the proposed scheme is efficient on reducing cell-to-cell interference with negligible overhead.
引用
收藏
页数:6
相关论文
共 31 条
  • [1] Degradation Mechanisms of the Program Characteristics of 10 nm NAND Flash Memories Due to Cell-to-Cell Interference
    Ryu, Ju Tae
    Kim, Tae Whan
    [J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2013, 13 (09) : 6420 - 6423
  • [2] Using Data Postcompensation and Predistortion to Tolerate Cell-to-Cell Interference in MLC NAND Flash Memory
    Dong, Guiqiang
    Li, Shu
    Zhang, Tong
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2010, 57 (10) : 2718 - 2728
  • [3] A zeroing cell-to-cell interference page architecture with temporary LSB storing and parallel MSB program scheme for MLC NAND flash memories
    Park, Ki-Tae
    Kang, Myounggon
    Kim, Doogon
    Hwang, Soon-Wook
    Choi, Byung Yong
    Lee, Yeong-Taek
    Kim, Changhyun
    Kim, Kinam
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2008, 43 (04) : 919 - 928
  • [4] Cell-to-Cell Interference Compensation Schemes Using Reduced Symbol Pattern of Interfering Cells for MLC NAND Flash Memory
    Kim, Taehyung
    Kong, Gyuyeol
    Xi Weiya
    Choi, Sooyong
    [J]. IEEE TRANSACTIONS ON MAGNETICS, 2013, 49 (06) : 2569 - 2573
  • [5] Cell-to-Cell Interference Compensation Schemes Using Reduced Symbol Pattern of Interfering Cells for MLC NAND Flash Memory
    Kong, G.
    Kim, T.
    Xi, W.
    Choi, S.
    [J]. 2012 DIGEST ASIA-PACIFIC MAGNETIC RECORDING CONFERENCE (APMRC), 2012,
  • [6] A zeroing cell-to-cell interference page architecture with temporary LSB storing program scheme for sub-40nm MLC NAND flash memories and beyond
    Park, Ki-Tae
    Kang, Myounggon
    Kim, Doogon
    Hwang, Soonwook
    Lee, Yeong-Taek
    Kim, Changhyun
    Kim, Kinam
    [J]. 2007 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS, 2007, : 188 - 189
  • [7] A New Read Scheme for Alleviating Cell-to-Cell Interference in Scaled-Down 3D NAND Flash Memory
    Sim, Jae-Min
    Kang, Myounggon
    Song, Yun-Heub
    [J]. ELECTRONICS, 2020, 9 (11) : 1 - 9
  • [8] Techniques for Embracing Intra-Cell Unbalanced Bit Error Characteristics in MLC NAND Flash Memory
    Dong, Guiqiang
    Xie, Ningde
    Zhang, Tong
    [J]. 2010 IEEE GLOBECOM WORKSHOPS, 2010, : 1915 - 1920
  • [9] Direct Field Effect of Neighboring Cell Transistor on Cell-to-Cell Interference of NAND Flash Cell Arrays
    Park, Mincheol
    Kim, Keonsoo
    Park, Jong-Ho
    Choi, Jeong-Hyuck
    [J]. IEEE ELECTRON DEVICE LETTERS, 2009, 30 (02) : 174 - 177
  • [10] Induced Variability of Cell-to-Cell Interference by Line Edge Roughness in NAND Flash Arrays
    Poliakov, Pavel
    Blomme, Pieter
    Pret, Alessandro Vaglio
    Corbalan, Miguel Miranda
    Gronheid, Roel
    Verkest, Diederik
    Van Houdt, Jan
    Dehaene, Wim
    [J]. IEEE ELECTRON DEVICE LETTERS, 2012, 33 (02) : 164 - 166