Anti-PVT-Variation Low-Power Time-to-Digital Converter Design Using 90-nm CMOS Process

被引:11
|
作者
Wang, Chua-Chin [1 ,2 ]
Chao, Kuan-Yu [1 ]
Sampath, Sivaperumal [3 ]
Suresh, Ponnan [3 ]
机构
[1] Natl Sun Yat Sen Univ, Dept Elect Engn, Kaohsiung 80424, Taiwan
[2] Natl Sun Yat Sen Univ, Inst Undersea Technol, Kaohsiung 80424, Taiwan
[3] Vel Tech, Dept Elect & Commun Engn, Chennai 600054, Tamil Nadu, India
关键词
Delays; Detectors; Image edge detection; Very large scale integration; Temperature measurement; Feature extraction; D flip-flip (DFF); process voltage and temperature (PVT); PVT corner detector; synchronization; time-to-digital converter (TDC); ADC;
D O I
10.1109/TVLSI.2020.3008424
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
One of the most important functional units in digital circuitry for synchronization and measurement is time-to-digital converter (TDC) which always requires higher resolution and accuracy. In this brief, a process, voltage, temperature (PVT)-variation-insensitive TDC featured with a PVT detector is proposed. The PVT detector takes advantage of another delay line with optimized locking conditions to differentiate PVT corners. The proposed TDC is physically realized using a 90-nm CMOS process. On-silicon measurement results demonstrate 30-ps resolution, < 1.5 LSB INL/DNL, and 2.22 mW at 100 MHz and 1.2-V supply voltage.
引用
收藏
页码:2069 / 2073
页数:5
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