Study on Interconnect Test with Multiple Scan Chains Based on VXIbus Boundary Scan Module

被引：0
|
作者：
Yin Xianhua [1 ]
Zhu Wangchun [1 ]
Mo Taiping [1 ]
机构：
[1] Guilin Univ Elect Technol, Elect Engineer Sch, Guilin 541004, Peoples R China
来源：
PROCEEDINGS OF THE SECOND INTERNATIONAL SYMPOSIUM ON TEST AUTOMATION & INSTRUMENTATION, VOLS 1-2 | 2008年
关键词：
boundary scan; multiple scan chains; interconnect test;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
The use of multiple scan chains for interconnect test is analyzed. Based on the researches on greedy strategy for configuring multiple scan chains for internal test and the sorting algorithm of single scan chain for Cluster test, a solution of configuring and optimizing multiple scan chains for interconnect test is presented. It will aim to decrease the test time and increase the efficiency and reliability for interconnect test: significantly. Experiment results show that the expected design objective is achieved.
引用
收藏
页码：119 / 123
页数：5
相关论文
共 50 条
  • [31] Deterministic BIST with multiple scan chains
    Kiefer, G
    Wunderlich, HJ
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1999, 14 (1-2): : 85 - 93
  • [32] Deterministic BIST with multiple scan chains
    Kiefer, G
    Wunderlich, HJ
    INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, : 1057 - 1064
  • [33] Deterministic BIST with Multiple Scan Chains
    Gundolf Kiefer
    Hans-Joachim Wunderlich
    Journal of Electronic Testing, 1999, 14 : 85 - 93
  • [34] Deterministic BIST with multiple scan chains
    Kiefer, Gundolf
    Wunderlich, Hans-Joachim
    Journal of Electronic Testing: Theory and Applications (JETTA), 1999, 14 (01): : 85 - 93
  • [35] OPTIMAL CONFIGURING OF MULTIPLE SCAN CHAINS
    NARAYANAN, S
    GUPTA, R
    BREUER, MA
    IEEE TRANSACTIONS ON COMPUTERS, 1993, 42 (09) : 1121 - 1131
  • [36] Reducing test data volume using random-testable and periodic-testable scan chains in circuits with multiple scan chains
    Pomeranz, I
    INTERNATIONAL TEST CONFERENCE 2003, PROCEEDINGS, 2003, : 441 - 450
  • [37] Test data compression method for multiple scan chains based on repeated sub-vectors
    Yu, Yang
    Peng, Xiyuan
    Zhang, Yigang
    Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument, 2009, 30 (02): : 356 - 361
  • [38] Test pattern generation in built-in self-test with multiple scan chains
    Li, Z.L.
    Ye, Y.Z.
    Mao, Z.G.
    Jisuanji Xuebao/Chinese Journal of Computers, 2001, 24 (04): : 411 - 419
  • [39] A BIST scheme for multiple scan chains based on folding computing
    Li, Y. (leentsm@126.com), 1600, Institute of Computing Technology (25):
  • [40] Efficient test architecture based on boundary scan for comprehensive system test
    Chakraborty, TJ
    14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2005, : 464 - 464
12345