Study on Interconnect Test with Multiple Scan Chains Based on VXIbus Boundary Scan Module

被引：0
|
作者：
Yin Xianhua [1 ]
Zhu Wangchun [1 ]
Mo Taiping [1 ]
机构：
[1] Guilin Univ Elect Technol, Elect Engineer Sch, Guilin 541004, Peoples R China
来源：
PROCEEDINGS OF THE SECOND INTERNATIONAL SYMPOSIUM ON TEST AUTOMATION & INSTRUMENTATION, VOLS 1-2 | 2008年
关键词：
boundary scan; multiple scan chains; interconnect test;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
The use of multiple scan chains for interconnect test is analyzed. Based on the researches on greedy strategy for configuring multiple scan chains for internal test and the sorting algorithm of single scan chain for Cluster test, a solution of configuring and optimizing multiple scan chains for interconnect test is presented. It will aim to decrease the test time and increase the efficiency and reliability for interconnect test: significantly. Experiment results show that the expected design objective is achieved.
引用
收藏
页码：119 / 123
页数：5
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