Superconducting material diagnostics using a scanning near-field microwave microscope

被引：13
|
作者：
Anlage, SM [1 ]
Steinhauer, DE [1 ]
Vlahacos, CP [1 ]
Feenstra, BJ [1 ]
Thanawalla, AS [1 ]
Hu, WS [1 ]
Dutta, SK [1 ]
Wellstood, FC [1 ]
机构：
[1] Univ Maryland, Dept Phys, Ctr Superconduct Res, College Pk, MD 20742 USA
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1999年 / 9卷 / 02期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1109/77.783934
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 mu m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7.delta thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of T-c of a YBa2Cu3O7.delta thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.
引用
收藏
页码：4127 / 4132
页数：6
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