Nondestructive imaging of the microwave properties of superconducting thin film devices with a scanning microwave near-field microscope

被引：3
|
作者：
Feng, YJ [1 ]
Liu, L [1 ]
Liu, QG [1 ]
You, LX [1 ]
Kang, L [1 ]
Yang, SZ [1 ]
Wu, PH [1 ]
机构：
[1] Nanjing Univ, Dept Elect Sci & Engn, Nanjing 210093, Peoples R China
来源：
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2000年 / 341卷
基金：
中国国家自然科学基金;
关键词：
D O I：
10.1016/S0921-4534(00)01438-6
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
In this paper, nondestructive microwave scanning techniques have been used to image the local microwave properties of planar microwave devices. A coaxial cavity, together with a niobium tip, has been used as a probe in the scanning microwave near-field microscope. Quantitative images of the dielectric constant of the substrates as well as the variations of the surface resistance of the line patterns in the metal multilayers have been obtained. Local surface resistances at 3GHz have been measured on microwave devices prepared with laser ablated YBaCuO thin films, which helps in evaluating the performance of the devices.
引用
收藏
页码：2651 / 2652
页数：2
相关论文
共 50 条
  • [1] Probing the local microwave properties of superconducting thin films by a scanning microwave near-field microscope
    Wu, LY
    Feng, YJ
    Wang, KL
    Jiang, T
    Kang, L
    Yang, SZ
    Wu, PH
    [J]. SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2002, 15 (12): : 1771 - 1774
  • [2] Imaging microwave electric fields using a near-field scanning microwave microscope
    Dutta, SK
    Vlahacos, CP
    Steinhauer, DE
    Thanawalla, AS
    Feenstra, BJ
    Wellstood, FC
    Anlage, SM
    Newman, HS
    [J]. APPLIED PHYSICS LETTERS, 1999, 74 (01) : 156 - 158
  • [3] Surface resistance imaging with a scanning near-field microwave microscope
    Steinhauer, DE
    Vlahacos, CP
    Dutta, SK
    Wellstood, FC
    Anlage, SM
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (12) : 1736 - 1738
  • [4] Superconducting material diagnostics using a scanning near-field microwave microscope
    Anlage, SM
    Steinhauer, DE
    Vlahacos, CP
    Feenstra, BJ
    Thanawalla, AS
    Hu, WS
    Dutta, SK
    Wellstood, FC
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) : 4127 - 4132
  • [5] Frequency following imaging of electric fields from resonant superconducting devices using a scanning near-field microwave microscope
    Thanawalla, AS
    Feenstra, BJ
    Hu, WS
    Steinhauer, DE
    Dutta, SK
    Anlage, SM
    Wellstood, FC
    Hammond, RB
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) : 3042 - 3045
  • [6] Scanning tip microwave near-field microscope
    Wei, T
    Xiang, XD
    WallaceFreedman, WG
    Schultz, PG
    [J]. APPLIED PHYSICS LETTERS, 1996, 68 (24) : 3506 - 3508
  • [7] Magnetic permeability imaging of metals with a scanning near-field microwave microscope
    Lee, SC
    Vlahacos, CP
    Feenstra, BJ
    Schwartz, A
    Steinhauer, DE
    Wellstood, FC
    Anlage, SM
    [J]. APPLIED PHYSICS LETTERS, 2000, 77 (26) : 4404 - 4406
  • [8] Quantitative topographic imaging using a near-field scanning microwave microscope
    Vlahacos, CP
    Steinhauer, DE
    Dutta, SK
    Feenstra, BJ
    Anlage, SM
    Wellstood, FC
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (14) : 1778 - 1780
  • [9] Quantitative imaging of sheet resistance with a scanning near-field microwave microscope
    Steinhauer, DE
    Vlahacos, CP
    Dutta, SK
    Feenstra, BJ
    Wellstood, FC
    Anlage, SM
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (07) : 861 - 863
  • [10] Resonator probe for near-field scanning microwave microscope
    Gordienko, Yu. Ye
    Ryabukhin, A. A.
    Slipchenko, N. I.
    Ananyin, V. V.
    [J]. 2005 15TH INTERNATIONAL CRIMEAN CONFERENCE MICROWAVE & TELECOMMUNICATION TECHNOLOGY, VOLS 1 AND 2, CONFERENCE PROCEEDINGS, 2005, : 721 - 722
12345