Imaging microwave electric fields using a near-field scanning microwave microscope

被引：70
|
作者：
Dutta, SK [1 ]
Vlahacos, CP
Steinhauer, DE
Thanawalla, AS
Feenstra, BJ
Wellstood, FC
Anlage, SM
Newman, HS
机构：
[1] Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA
[2] USN, Res Lab, Washington, DC 20375 USA
来源：
APPLIED PHYSICS LETTERS | 1999年 / 74卷 / 01期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.123137
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center conductor, allowing different components of the field to be imaged by orienting the probe appropriately. Using a simple model of the microscope, we are able to interpret the system's output and determine the magnitude of the electric field at the probe tip. We show images of electric field components above a copper microstrip transmission line driven at 8 GHz, with a spatial resolution of approximately 200 mm. (C) 1999 American Institute of Physics. [S0003-6951(99)05201-8].
引用
收藏
页码：156 / 158
页数：3
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