Probing the local microwave properties of superconducting thin films by a scanning microwave near-field microscope

被引：1

作者：

Wu, LY ^{[1
]}

Feng, YJ ^{[1
]}

Wang, KL ^{[1
]}

Jiang, T ^{[1
]}

Kang, L ^{[1
]}

Yang, SZ ^{[1
]}

Wu, PH ^{[1
]}

机构：

[1] Nanjing Univ, Res Inst Superconductor Elect, Dept Elect Sci & Engn, Nanjing 210093, Peoples R China

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 2002年 / 15卷 / 12期

关键词：

Coaxial cables - Dielectric properties - Field emission microscopes - High temperature superconductors - Microwave devices - Scanning - Superconductivity - Thin films;

D O I：

10.1088/0953-2048/15/12/330

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this paper, we present our approach to probe the local microwave properties of superconducting thin films by using the microwave near-field scanning technique. We have employed a coaxial cavity together with a niobium tip as the probe and established a scanning sample stage cooled by liquid nitrogen to study thin film devices at low temperature in our scanning microwave near-field microscope. Nondestructive images have been obtained on the inhomogeneity of the YBaCuO superconducting thin films at microwave frequency. We believe that these results would be helpful in evaluating the microwave performance of the devices.

引用

页码：1771 / 1774

页数：4

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