Superconducting material diagnostics using a scanning near-field microwave microscope

被引：13

作者：

Anlage, SM ^{[1
]}

Steinhauer, DE ^{[1
]}

Vlahacos, CP ^{[1
]}

Feenstra, BJ ^{[1
]}

Thanawalla, AS ^{[1
]}

Hu, WS ^{[1
]}

Dutta, SK ^{[1
]}

Wellstood, FC ^{[1
]}

机构：

[1] Univ Maryland, Dept Phys, Ctr Superconduct Res, College Pk, MD 20742 USA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1999年 / 9卷 / 02期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/77.783934

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 mu m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7.delta thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of T-c of a YBa2Cu3O7.delta thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.

引用

页码：4127 / 4132

页数：6

共 50 条

[31] A scanning near-field optical microscope
Baiburin, VB
Volkov, YP
Konnov, NP
[J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1998, 41 (02) : 277 - 279
[32] SCANNING PLASMON NEAR-FIELD MICROSCOPE
SPECHT, M
PEDARNIG, JD
HECKL, WM
HANSCH, TW
[J]. PHYSICAL REVIEW LETTERS, 1992, 68 (04) : 476 - 479
[33] Near-field scanning optical microscope
Volkov, UP
Baibyrin, VB
Konnov, NP
Mironychev, AP
Bespalova, NV
[J]. SARATOV FALL MEETING 2002: OPTICAL TECHNOLOGIES IN BIOPHYSICS AND MEDICINE IV, 2002, 5068 : 411 - 416
[34] NEAR-FIELD SCANNING ACOUSTIC MICROSCOPE
KHURIYAKUB, BT
CINBIS, C
CHOU, CH
REINHOLDTSEN, PA
[J]. IEEE 1989 ULTRASONICS SYMPOSIUM : PROCEEDINGS, VOLS 1 AND 2, 1989, : 805 - 807
[35] The near-field scanning thermal microscope
Wischnath, Uli F.
Welker, Joachim
Munzel, Marco
Kittel, Achim
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (07):
[36] Versatile scanning near-field optical microscope for material science applications
Gucciardi, PG
Labardi, M
Gennai, S
Lazzeri, F
Allegrini, M
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (08): : 3088 - 3092
[37] Near-field interference microwave diagnostics
Belichenko, V. P.
Zapasnoy, A. S.
Mironchev, A. S.
Matvievskiy, E. V.
[J]. INTERNATIONAL CONFERENCE ON INNOVATIONS IN NON-DESTRUCTIVE TESTING (SIBTEST), 2017, 881
[38] Near-field optics imaging in silica waveguide using near-field scanning optical microscope
Chau, Yuan-Fong
Tsai, Din Ping
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (01): : 238 - 242
[39] Near-field microwave microscope measurements to characterize bulk material properties
Imtiaz, Atif
Baldwin, Thomas
Nembach, Hans T.
Wallis, Thomas M.
Kabos, Pavel
[J]. APPLIED PHYSICS LETTERS, 2007, 90 (24)
[40] Distance control for a near-field scanning microwave microscope in liquid using a quartz tuning fork
Kim, S
Yoo, H
Lee, K
Friedman, B
Gaspar, MA
Levicky, R
[J]. APPLIED PHYSICS LETTERS, 2005, 86 (15) : 1 - 3

← 1 2 3 4 5 →