Analyzing fault models for reversible logic circuits

Reversible logic computing is a rapidly developing research area. Testing such circuits is obviously an important issue. In this paper, we consider a new fault model, labeled crosspoint faults, for reversible logic circuits. A randomized Automatic Test Pattern Generation algorithm targeting this specific kind of fault is introduced and analyzed. Simulation results show that the algorithm yields very good performance. The relationship between the crosspoint faults and stuck-at faults is also investigated. We show that the crosspoint fault model is a better fault model for reversible circuits since it dominates the traditional stuck-at fault model in most instances.