Online Testing for Three Fault Models in Reversible Circuits

被引：9

作者：

Nashiry, Md Asif ^{[1
]}

Bhaskar, Gite Gaurav ^{[2
]}

Rice, Jacqueline E. ^{[1
]}

机构：

[1] Univ Lethbridge, Dept Math & Comp Sci, Lethbridge, AB, Canada

[2] Indian Inst Technol Roorkee, Dept Elect Engn, Roorkee, Uttar Pradesh, India

来源：

2015 IEEE 45TH INTERNATIONAL SYMPOSIUM ON MULTIPLE-VALUED LOGIC | 2015年

关键词：

D O I：

10.1109/ISMVL.2015.36

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we propose an approach for the design of online testable reversible circuits. A reversible circuit composed of Toffoli gates can be made online testable by adding two sets of CNOT gates and a single parity line. The performance of the proposed approach for detecting a single bit fault, a crosspoint fault and the family of missing gate faults has been observed. Discussion around the correctness of our approach and the overhead is also provided.

引用

页码：8 / 13

页数：6

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