Reliable single-ended ultra-low power GNRFETs-based 9T SRAM cell with improved read and write operations

This paper presents a reliable single-ended nine-transistor (9T) static random access memory (SRAM) cell which is based on 16 nm graphene nanoribbon FETs (GNRFETs) technology. Single-ended operation significantly reduces switching activity and layout area. Therefore, the power consumption and area of the proposed cell is enhanced by 48.9 % and 3.8 %, respectively, as compared to the 2-bitline (2-BL) 9T SRAM cell. A separate read and write port provides significant improvement in the read and write performance simultaneously. The performance of the proposed cell and other existing cells are evaluated using HSPICE-simulations. The multithreshold technology is used to improve the performance of cells in terms of delay and power consumption. The proposed cell shows significant improvement in read stability and write-ability due to proper device sizing ratio. In nanometer regime, the cell is capable to operate at ultra low supply voltage of 300 mV due to outstanding electrical property of the GNRFETs devices.