SRAM-based FPGAs: Testing the embedded RAM modules

被引：0
|
作者：
Renovell, Michel [1 ]
Portal, Jean-Michel [1 ]
Figueras, Joan [2 ]
Zorian, Yervant [3 ,4 ]
机构：
[1] LIRMM-UM2, 161 Rue Ada, 34392 Montpellier Cedex, France
[2] UPC Diagonal, 647 Barcelona, Spain
[3] Logic Vision Inc., 101 Metro Drive, San Jose, CA 95110, United States
[4] Logic Vision, Inc., San Jose, CA, United States
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1999年 / 14卷 / 01期
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页码：159 / 167
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