SRAM-based FPGAs: Testing the embedded RAM modules

被引：0
|
作者：
Renovell, Michel [1 ]
Portal, Jean-Michel [1 ]
Figueras, Joan [2 ]
Zorian, Yervant [3 ,4 ]
机构：
[1] LIRMM-UM2, 161 Rue Ada, 34392 Montpellier Cedex, France
[2] UPC Diagonal, 647 Barcelona, Spain
[3] Logic Vision Inc., 101 Metro Drive, San Jose, CA 95110, United States
[4] Logic Vision, Inc., San Jose, CA, United States
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1999年 / 14卷 / 01期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：159 / 167
相关论文
共 50 条
  • [41] Analysis of the robustness of the TMR architecture in SRAM-based FPGAs
    Sterpone, L
    Violante, M
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2005, 52 (05) : 1545 - 1549
  • [42] Redundant-Configuration Scrubbing of SRAM-Based FPGAs
    Giordano, Raffaele
    Perrella, Sabrina
    Izzo, Vincenzo
    Milluzzo, Giuliana
    Aloisio, Alberto
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 64 (09) : 2497 - 2504
  • [43] A Flexible Inexact TMR Technique for SRAM-based FPGAs
    Venkataraman, Shyamsundar
    Santos, Rui
    Kumar, Akash
    PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2016, : 810 - 813
  • [44] Designing fault tolerant systems into SRAM-based FPGAs
    Lima, F
    Carro, L
    Reis, R
    40TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2003, 2003, : 650 - 655
  • [45] Validation of FDIR Strategy for Spaceborne SRAM-Based FPGAs using Proton Radiation Testing
    Siegle, Felix
    Vladimirova, Tanya
    Poivey, Christian
    Emam, Omar
    2015 15TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS), 2015,
  • [46] A single event transient detector in SRAM-based FPGAs
    Xu, Xiumin
    Liang, Huaguo
    Huang, Zhengfeng
    Jiang, Cuiyun
    Lu, Yingchun
    Yan, Aibin
    Ni, Tianming
    Yi, Maoxiang
    IEICE ELECTRONICS EXPRESS, 2017, 14 (12):
  • [47] Neutron single event upsets in SRAM-based FPGAs
    Ohlsson, M
    Dyreklev, P
    Johansson, K
    Alfke, P
    1998 IEEE RADIATION EFFECTS DATA WORKSHOP, 1998, : 177 - 180
  • [48] On the Evaluation of the PIPB Effect within SRAM-based FPGAs
    De Sio, Corrado
    Azimi, Sarah
    Sterpone, Luca
    2019 IEEE EUROPEAN TEST SYMPOSIUM (ETS), 2019,
  • [49] A highly reliable butterfly PUF in SRAM-based FPGAs
    Xu, Xiumin
    Liang, Huaguo
    Huang, Zhengfeng
    Jiang, Cuiyun
    Ouyang, Yiming
    Fang, Xiangsheng
    Ni, Tianming
    Yi, Maoxiang
    IEICE ELECTRONICS EXPRESS, 2017, 14 (14): : 1 - 6
  • [50] Neutron Radiation Testing of RISC-V TMR Soft Processors on SRAM-Based FPGAs
    Wilson, Andrew E.
    Wirthlin, Michael
    Baker, Nathan G.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2023, 70 (04) : 603 - 610
12345