Neutron Radiation Testing of a TMR VexRiscv Soft Processor on SRAM-Based FPGAs

被引：15

作者：

Wilson, Andrew E. ^{[1
]}

Larsen, Sam ^{[1
]}

Wilson, Christopher ^{[1
]}

Thurlow, Corbin ^{[1
]}

Wirthlin, Michael ^{[1
]}

机构：

[1] Brigham Young Univ, NSF Ctr Space High Performance & Resilient Comp S, Provo, UT 84602 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2021年 / 68卷 / 05期

基金：

美国国家科学基金会;

关键词：

Fault injection; fault tolerance; field-programmable gate array (FPGA); radiation hardening by design; radiation testing; redundancy; RISC-V; single-event upset (SEU); soft processor; triple modular redundancy (TMR);

D O I：

10.1109/TNS.2021.3068835

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Soft processors are often used within field-programmable gate array (FPGA) designs in radiation hazardous environments. These systems are susceptible to single-event upsets (SEUs) that can corrupt both the hardware configuration and software implementation. Mitigation of these SEUs can be accomplished by applying triple modular redundancy (TMR) techniques to the processor. This article presents fault injection and neutron radiation results of a Linux-capable TMR VexRiscv processor. The TMR processor achieved a 10x improvement in SEU-induced mean fluence to failure with a cost of 4x resource utilization. To further understand the TMR system failures, additional post-radiation fault injection was performed with targets generated from the radiation data. This analysis showed that not all the failures were due to single-bit upsets, but potentially caused by multibit upsets, nontriplicated IO, and unmonitored nonconfiguration RAM (CRAM) SEUs.

引用

页码：1054 / 1060

页数：7

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