Nitrogen implantation in 4H and 6H-SiC

被引:0
|
作者
LETI-CEA, Département de Micro-technologies, CEA-Grenoble, 17 rue des Martyrs, F-38054 Grenoble Cedex 9, France [1 ]
不详 [2 ]
不详 [3 ]
不详 [4 ]
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] Optimization of 2H, 4H and 6H-SiC MESFETs for high-frequency applications
    Bertilsson, K
    Nilsson, HE
    PHYSICA SCRIPTA, 2002, T101 : 75 - 77
  • [42] Hydrogen passivation of nitrogen in 6H-SiC
    Theys, B
    Gendron, F
    Porte, C
    Bringuier, E
    Dolin, C
    JOURNAL OF APPLIED PHYSICS, 1997, 82 (12) : 6346 - 6347
  • [43] Interaction of nitrogen with 6H-SiC surfaces
    Van Elsbergen, V
    Rohleder, M
    Monch, W
    WIDE-BANDGAP SEMICONDUCTORS FOR HIGH POWER, HIGH FREQUENCY AND HIGH TEMPERATURE, 1998, 512 : 457 - 462
  • [44] Activation of nitrogen implants in 6H-SiC
    J. N. Pan
    J. A. Cooper
    M. R. Melloch
    Journal of Electronic Materials, 1997, 26 : 208 - 211
  • [45] Nitrogen doping concentration as determined by photoluminescence in 4H- and 6H-SiC
    Ivanov, IG
    Hallin, C
    Henry, A
    Kordina, O
    Janzen, E
    JOURNAL OF APPLIED PHYSICS, 1996, 80 (06) : 3504 - 3508
  • [46] Excitation spectra of nitrogen bound excitons in 4H-and 6H-SiC
    Egilsson, T
    Ivanov, IG
    Henry, A
    Janzén, E
    JOURNAL OF APPLIED PHYSICS, 2002, 91 (04) : 2028 - 2032
  • [47] Nitrogen-related point defect in 4H and 6H SiC
    Zvanut, M. E.
    van Tol, J.
    PHYSICA B-CONDENSED MATTER, 2007, 401 : 73 - 76
  • [48] The effect of Si:C source ratio on SiO2/SiC interface state density for nitrogen doped 4H and 6H-SIC
    Chung, GY
    Tin, CC
    Won, JH
    Williams, JR
    SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, 2000, 338-3 : 1097 - 1100
  • [49] High voltage Schottky barrier diodes on p-type 4H and 6H-SiC
    Raghunathan, R
    Baliga, BJ
    SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 : 933 - 936
  • [50] Electron transport modeling in the inversion layers of 4H and 6H-SiC MOSFETs on implanted regions
    Zeng, YA
    White, MH
    Das, MK
    SOLID-STATE ELECTRONICS, 2005, 49 (06) : 1017 - 1028