High voltage Schottky barrier diodes on p-type 4H and 6H-SiC

被引:0
|
作者
Raghunathan, R [1 ]
Baliga, BJ [1 ]
机构
[1] N Carolina State Univ, Power Semicond Res Ctr, Raleigh, NC 27606 USA
关键词
high voltage; Schottky contacts; series resistance; barrier height; leakage current;
D O I
10.4028/www.scientific.net/MSF.264-268.933
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Schottky barrier diodes with goad rectifying characteristics upto temperatures as high as 250 C have been successfully fabricated for the first time on p-type 4H-SiC and 6H-SiC using Ti as the barrier metal. The barrier heights were extracted at room temperatures using both I-V and C-V measurements and found to be 1.8 - 2.0 eV for 6H-SiC and 1.4 - 1.5 eV for 4H-SiC. The specific series resistances (R-s,R-sp) for 4H- and 6H-SiC calculated from a plot of IdV/dI vs V were found to be 25 m Omega cm(-2) and 70 m Omega cm(-2) at room temperature and found to decrease with increasing temperatures.
引用
收藏
页码:933 / 936
页数:4
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