Polycrystal orientation mapping using scanning three-dimensional X-ray diffraction microscopy

被引：0
|
作者：
Hayashi, Yujiro [1 ]
Hirose, Yoshiharu [1 ]
Seno, Yoshiki [1 ]
机构：
[1] Toyota Central RandD Laboratories Inc., Nagakute, Aichi,480-1192, Japan
来源：
Journal of Applied Crystallography | 2015年 / 48卷
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
X ray diffraction
引用
收藏
页码：1094 / 1101
相关论文
共 50 条
  • [21] Reciprocal space mapping and strain scanning using X-ray diffraction microscopy
    Poulsen, H. F.
    Cook, P. K.
    Leemreize, H.
    Pedersen, A. F.
    Yildirim, C.
    Kutsal, M.
    Jakobsen, A. C.
    Trujillo, J. X.
    Ormstrup, J.
    Detlefs, C.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2018, 51 : 1428 - 1436
  • [22] Three-Dimensional X-Ray Diffraction Microscopy Using High-Energy X-Rays
    Henning F. Poulsen
    Dorte Juul Jensen
    Gavin B. M. Vaughan
    MRS Bulletin, 2004, 29 : 166 - 169
  • [23] Three-dimensional x-ray diffraction microscopy using high-energy x-rays
    Poulsen, HF
    Jensen, DJ
    Vaughan, GBM
    MRS BULLETIN, 2004, 29 (03) : 166 - 169
  • [24] Three-dimensional x-ray diffraction nanoscopy
    Nikulin, Andrei Y.
    Dilanian, Ruben A.
    Zatsepin, Nadia A.
    Muddle, Barry C.
    INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING II, 2008, 7042
  • [25] Novel Near Field Detector for Three-Dimensional X-Ray Diffraction Microscopy
    Scott Annett
    Sergio Morelhao
    Darren Dale
    Stefan Kycia
    MRS Advances, 2018, 3 (39) : 2341 - 2346
  • [26] Novel Near Field Detector for Three-Dimensional X-Ray Diffraction Microscopy
    Annett, Scott
    Morelhao, Sergio
    Dale, Darren
    Kycia, Stefan
    MRS ADVANCES, 2018, 3 (39): : 2341 - 2346
  • [27] Three-dimensional optical trapping and orientation of microparticles for coherent X-ray diffraction imaging
    Gao, Yuan
    Harder, Ross
    Southworth, Stephen H.
    Guest, Jeffrey R.
    Huang, Xiaojing
    Yan, Zijie
    Ocola, Leonidas E.
    Yifat, Yuval
    Sule, Nishant
    Ho, Phay J.
    Pelton, Matthew
    Scherer, Norbert F.
    Young, Linda
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2019, 116 (10) : 4018 - 4024
  • [28] Application of a pnCCD in X-ray diffraction:: a three-dimensional X-ray detector
    Leitenberger, Wolfram
    Hartmann, Robert
    Pietsch, Ullrich
    Andritschke, Robert
    Starke, Ines
    Strueder, Lothar
    JOURNAL OF SYNCHROTRON RADIATION, 2008, 15 (05) : 449 - 457
  • [29] Non-destructive characterization of recrystallization kinetics using three-dimensional X-ray diffraction microscopy
    Lauridsen, E. M.
    Schmidt, S.
    Nielsen, S. F.
    Margulies, L.
    Poulsen, H. F.
    Jensen, D. Juul
    SCRIPTA MATERIALIA, 2006, 55 (01) : 51 - 56
  • [30] Three-dimensional x-ray diffraction detection and visualization
    Allahkarami, Masoud
    Hanan, Jay C.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2014, 25 (05)
12345