Polycrystal orientation mapping using scanning three-dimensional X-ray diffraction microscopy

被引:0
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作者
Hayashi, Yujiro [1 ]
Hirose, Yoshiharu [1 ]
Seno, Yoshiki [1 ]
机构
[1] Toyota Central RandD Laboratories Inc., Nagakute, Aichi,480-1192, Japan
关键词
Compendex;
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学科分类号
摘要
X ray diffraction
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页码:1094 / 1101
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