Polycrystal orientation mapping using scanning three-dimensional X-ray diffraction microscopy

被引：0
|
作者：
Hayashi, Yujiro [1 ]
Hirose, Yoshiharu [1 ]
Seno, Yoshiki [1 ]
机构：
[1] Toyota Central RandD Laboratories Inc., Nagakute, Aichi,480-1192, Japan
来源：
Journal of Applied Crystallography | 2015年 / 48卷
关键词：
Compendex;
D O I：
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学科分类号：
摘要：
X ray diffraction
引用
收藏
页码：1094 / 1101
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