HIGH-LEVEL TEST-GENERATION FOR VLSI

被引：0

作者：

BHATTACHARYA, D

MURRAY, BT

HAYES, JP

机构：

[1] UNIV MICHIGAN,DEPT ELECT ENGN & COMP SCI,ADV COMP ARCHITECTURE LAB,ANN ARBOR,MI 48109

[2] YALE UNIV,NEW HAVEN,CT 06520

[3] GM CORP,RES LABS,WARREN,MI 48090

[4] UNIV MICHIGAN,DEPT ELECT ENGN,ANN ARBOR,MI 48109

来源：

COMPUTER | 1989年 / 22卷 / 04期

关键词：

D O I：

10.1109/2.25379

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：16 / 24

页数：9

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