HIGH-LEVEL TEST-GENERATION FOR VLSI

被引：0
|
作者：
BHATTACHARYA, D
MURRAY, BT
HAYES, JP
机构：
[1] UNIV MICHIGAN,DEPT ELECT ENGN & COMP SCI,ADV COMP ARCHITECTURE LAB,ANN ARBOR,MI 48109
[2] YALE UNIV,NEW HAVEN,CT 06520
[3] GM CORP,RES LABS,WARREN,MI 48090
[4] UNIV MICHIGAN,DEPT ELECT ENGN,ANN ARBOR,MI 48109
来源：
COMPUTER | 1989年 / 22卷 / 04期
关键词：
D O I：
10.1109/2.25379
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：16 / 24
页数：9
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