共 50 条
- [22] DESIGN AND TESTING OF EASILY TESTABLE PLA IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES, 1991, 138 (05): : 357 - 360
- [24] TESTABLE CHIP DESIGN STRUCTURE. IBM technical disclosure bulletin, 1985, 28 (06): : 2297 - 2299
- [25] SIGNATURE-TESTABLE LSSD-STRUCTURES AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1990, (01): : 94 - 95
- [28] DESIGN OF EASILY TESTABLE ITERATIVE SYSTEMS MICROPROCESSING AND MICROPROGRAMMING, 1987, 20 (1-3): : 141 - 146
- [29] Design of a fast, easily testable ALU 14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, : 9 - 16