Design of a fast, easily testable ALU

被引：5

作者：

Blanton, RD ^{[1
]}

Hayes, JP ^{[1
]}

机构：

[1] CARNEGIE MELLON UNIV,ECE DEPT,PITTSBURGH,PA 15213

来源：

关键词：

D O I：

10.1109/VTEST.1996.510829

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：9 / 16

页数：8

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