EASILY TESTABLE DESIGN OF LARGE DIGITAL CIRCUITS.

被引：0

作者：

Funatsu, Shigehiro

Wakatsuki, Nobuo

Yamada, Akihiko

机构：

来源：

NEC Research and Development | 1979年 / 54期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

INTEGRATED CIRCUITS, DIGITAL

引用

页码：49 / 55

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