EASILY TESTABLE DESIGN OF LARGE DIGITAL CIRCUITS.

被引：0
|
作者：
Funatsu, Shigehiro
Wakatsuki, Nobuo
Yamada, Akihiko
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来源：
NEC Research and Development | 1979年 / 54期
关键词：
Compendex;
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摘要：
INTEGRATED CIRCUITS, DIGITAL
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页码：49 / 55
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