EXPERIMENTAL STUDY OF AVALANCHE BREAKDOWN IN SILICON PLANAR P-N JUNCTIONS

被引：5

|

作者：

WILSON, PR

机构：

来源：

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1967年 / 55卷 / 08期

关键词：

D O I：

10.1109/PROC.1967.5854

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：1483 / &

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