FUNCTIONAL TESTING OF LOGIC-CIRCUITS BY COMPLETE PARTITIONING OF THE NON-FORBIDDEN STATES

被引：0

|

作者：

NOVIK, GK

机构：

来源：

SOVIET MICROELECTRONICS | 1982年 / 11卷 / 01期

关键词：

FUNCTIONAL TESTING - MICROCIRCUITS - SIGNATURE ANALYSIS;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：31 / 38

页数：8

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