PARTITIONING OF LOGIC-CIRCUITS FOR EXHAUSTIVE TESTING

被引：0

作者：

LALA, PK ^{[1
]}

TAO, DL ^{[1
]}

机构：

[1] SUNY STONY BROOK,DEPT ELECT ENGN,STONY BROOK,NY 13244

来源：

INTERNATIONAL JOURNAL OF ELECTRONICS | 1990年 / 69卷 / 02期

关键词：

D O I：

10.1080/00207219008920309

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Exhaustive testing of logic circuits eliminates the need for test generation and fault modelling. However, if a circuit has a large number of inputs, exhaustive testing becomes impracticable. A possible solution is to partition a circuit into subcircuits, each subcircuit having few enough inputs so that all possible combinations of its inputs can be applied to it. This paper presents such a partitioning technique. © 1990 Taylor & Francis Ltd.

引用

页码：225 / 231

页数：7

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