ON DELAY FAULT TESTING IN LOGIC-CIRCUITS

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作者：

LIN, CJ

REDDY, SM

机构：

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1987年 / 6卷 / 05期

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中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

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页码：694 / 703

页数：10

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