QUANTITATIVE CHEMICAL SURFACE, IN-DEPTH, AND BULK ANALYSIS BY SECONDARY NEUTRALS MASS-SPECTROMETRY (SNMS)

被引：0
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作者：
MULLER, KH
SEIFERT, K
WILMERS, M
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 03期
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TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
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页码：1367 / 1370
页数：4
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