SPUTTERED THERMAL ION MASS-SPECTROMETRY AS A NEW QUANTITATIVE METHOD FOR IN-DEPTH ANALYSIS

被引：0
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作者：
BLAISE, G [1 ]
机构：
[1] UNIV PARIS 11,PHYS SOLIDES LAB,F-91405 ORSAY,FRANCE
来源：
SCANNING ELECTRON MICROSCOPY | 1985年
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中图分类号：
TH742 [显微镜];
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页码：31 / 42
页数：12
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