QUANTITATIVE CHEMICAL SURFACE, IN-DEPTH, AND BULK ANALYSIS BY SECONDARY NEUTRALS MASS-SPECTROMETRY (SNMS)

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作者：

MULLER, KH

SEIFERT, K

WILMERS, M

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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 03期

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TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

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页码：1367 / 1370

页数：4

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