QUANTITATIVE-ANALYSIS IN CHEMICALLY DISSIMILAR MATRICES BY SECONDARY ION MASS-SPECTROMETRY

被引：0

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作者：

KATZ, W

SMITH, GA

WEI, CY

机构：

来源：

APPLIED SURFACE SCIENCE | 1983年 / 15卷 / 1-4期

关键词：

D O I：

10.1016/0378-5963(83)90020-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

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页码：247 / 254

页数：8

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