FUNCTIONAL TEST-GENERATION USING BINARY DECISION DIAGRAMS

被引：1
|
作者：
ABADIR, MS [1 ]
REGHBATI, HK [1 ]
机构：
[1] SIMON FRASER UNIV,SCH COMP SCI,BURNABY V5A 1S6,BC,CANADA
来源：
COMPUTERS & MATHEMATICS WITH APPLICATIONS | 1987年 / 13卷 / 5-6期
关键词：
D O I：
10.1016/0898-1221(87)90072-1
中图分类号：
O29 [应用数学];
学科分类号：
070104 ;
摘要：
引用
收藏
页码：413 / 430
页数：18
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