FUNCTIONAL TEST GENERATION USING BINARY DECISION DIAGRAMS.

被引：0
|
作者：
Abadir, M.S. [1 ]
Reghbati, H.K. [1 ]
机构：
[1] Univ of Southern California, Los, Angeles, CA, USA, Univ of Southern California, Los Angeles, CA, USA
来源：
Computers & mathematics with applications | 1987年 / 13卷 / 5-6期
关键词：
All Open Access; Bronze;
D O I：
暂无
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学科分类号：
摘要：
INTEGRATED CIRCUITS, LSI
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页码：413 / 430
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