FUNCTIONAL TEST GENERATION USING BINARY DECISION DIAGRAMS.

被引：0

作者：

Abadir, M.S. ^{[1
]}

Reghbati, H.K. ^{[1
]}

机构：

[1] Univ of Southern California, Los, Angeles, CA, USA, Univ of Southern California, Los Angeles, CA, USA

来源：

Computers & mathematics with applications | 1987年 / 13卷 / 5-6期

关键词：

All Open Access; Bronze;

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摘要：

INTEGRATED CIRCUITS, LSI

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页码：413 / 430

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