FUNCTIONAL TEST-GENERATION FOR DIGITAL CIRCUITS DESCRIBED USING BINARY DECISION DIAGRAMS

被引：0
|
作者：
ABADIR, MS [1 ]
REGHBATI, HK [1 ]
机构：
[1] SIMON FRASER UNIV,DEPT COMP SCI,BURNABY V5A 1S6,BC,CANADA
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1986年 / 35卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：375 / 379
页数：5
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