FUNCTIONAL TEST-GENERATION USING BINARY DECISION DIAGRAMS

被引：1

作者：

ABADIR, MS ^{[1
]}

REGHBATI, HK ^{[1
]}

机构：

[1] SIMON FRASER UNIV,SCH COMP SCI,BURNABY V5A 1S6,BC,CANADA

来源：

COMPUTERS & MATHEMATICS WITH APPLICATIONS | 1987年 / 13卷 / 5-6期

关键词：

D O I：

10.1016/0898-1221(87)90072-1

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

引用

页码：413 / 430

页数：18

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