TEST-GENERATION

被引：0

|

作者：

KARJALAINEN, J ^{[1
]}

机构：

[1] TECH RES CTR FINLAND,OULU,FINLAND

来源：

MICROPROCESSING AND MICROPROGRAMMING | 1986年 / 18卷 / 1-5期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：353 / 353

页数：1

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