AUTOMATIC DESIGN FOR TESTABILITY VIA TESTABILITY MEASURES

被引：0
|
作者：
CHEN, TH
BREUER, MA
机构：
[1] UNIV SO CALIF,DEPT ELECT ENGN SYST,LOS ANGELES,CA 90089
[2] UNIV SO CALIF,DEPT COMP SCI,LOS ANGELES,CA 90089
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1985年 / 4卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
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页码：3 / 11
页数：9
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