Design for testability: Today and in the future

被引：3
|
作者：
Williams, TW
机构：
来源：
TENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS | 1997年
关键词：
D O I：
10.1109/ICVD.1997.568096
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：314 / 315
页数：2
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