AUTOMATIC DESIGN FOR TESTABILITY VIA TESTABILITY MEASURES

被引：0

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作者：

CHEN, TH

BREUER, MA

机构：

[1] UNIV SO CALIF,DEPT ELECT ENGN SYST,LOS ANGELES,CA 90089

[2] UNIV SO CALIF,DEPT COMP SCI,LOS ANGELES,CA 90089

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1985年 / 4卷 / 01期

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中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

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页码：3 / 11

页数：9

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